Program

10:00 Walk-in and Innovation Market

10:30 Welcome and opening

Pasfoto Irene Rompa
moderator
Pasfoto Rogier Verberk
Director Semicon & Quantum
(TNO)

10:45 Panel discussion

Pasfoto Marc Hijink
technology reporter and columnist
(NRC)
Pasfoto Jeroen Dijsselbloem
Mayor of Eindhoven
(Brainport Eindhoven)
Pasfoto Robert-Jan Smits
President of the Executive Board
(Eindhoven University of Technology)
Pasfoto Sanne van der Lugt
Academic researcher and policy advisor
(Leiden Asia Centre)

Marc Hijink, journalist and author of FOCUS: the world of ASML, hosts a panel discussion on the challenges of the Dutch semicon industry.

11:30 Keynote Samsung

Pasfoto Dr. Younghoon Sohn
Master VP of Technology
(Samsung Memory, Metrology and inspection)
Role and Challenge of Semiconductor MI

We will discuss the role and challenge of MI. Various spectrum ranges in H/W have been attempted to be used to overcome the challenge. In the methodology the MI role is expanding to quality prediction by extracting hidden meaning with the help of AI technology, finally combining the MI role will expand for cognitive prediction and preventive action in the future.

11:45 Break

12:15 Keynote ASM

Pasfoto Ivo Raaijmakers
Corporate Vice President and Executive Advisor
(ASM)
Growth through Innovation

Artificial intelligence will drive a transition toward 3D architectures and lower power consumption, which in turn will need many advanced materials and deposition process innovations. ASM will address these opportunities in a sustainable way.

12:45 Keynote ASML

Pasfoto Marcel Muitjens
Vice President D&E Machine Conditioning
(ASML)
How to balance litho tool complexity within the semiconductor evolution? A challenge for our complete eco-system.

During the presentation the need from the semiconductor industry will be described generically. This will be translated to the future product portfolio of ASML. Based on that the technical challenges will be touched upon. It will be made clear that this requires a balancing act to create such a complex system taking into account requirements, regulations and policies.

 

13:15 Lunch, networking and Innovation Market

14:15 Breakout sessions round 1

14:15 Metrology and testing

Pasfoto Paul Planken
Groupleader/Professor
(ARCNL)
Pasfoto Aleksandar Andreski
R&D Scientist
(Salland Engineering)

Presentation Aleksandar Andreski: MEMS & Photonic Testing - Production testing of silicon devices in the More-than-Moore category is often not trivial due to various probing and measurement challenges. Salland together with partners has been developing new equipment and methods to improve production testing of specifically Photonic and MEMS devices. In this talk we shortly present our progress in this area. 

14:15 Public funding opportunities in the European Union and the Netherlands

Pasfoto Olaf Kievit
Sr Business Development Manager
(TNO)
Pasfoto Gerard van der Zon
Operational Director
(Holland High Tech)
Pasfoto Vera Janssen
Innovation Orchestrator
(TNO)

Public funding opportunities in the European Union and the Netherlands

14:15 Sustainability

Head of Reliability, Semiconductor Manufacturing Optics
(Zeiss)
Pasfoto Joe Trimboli
Senior Scientist Specialist
(TNO)

Presentation Joe Trimboli: Advanced Materials for PFAS-Free Applications

15:15 Breakout sessions round 2

15:15 Acoustic and E-beam Metrology

Pasfoto Benoit Quesson
Senior scientist
(TNO)
Pasfoto Jacob Hoogenboom
Associate professor
(Delft University of Technology)

Presentation Benoit Quesson: GHz half wavelength contact acoustic microscopy (HaWaCAM) - HaWaCAM is a new acoustical metrology technique developed by TNO using GHz scattering acoustics, the promising results indicate a strong potential for semiconductor inspection and metrology applications

Presentation Jacob Hoogenboom:Perspectives and challenges for electron-beam metrology - Electron microscopy offers nanometer resolution but also faces challenges that hamper routine application in semiconductor metrology. I will discuss these challenges and present some of our approaches towards tackling these from both a fundamental and an engineering perspective.

15:15 Future Mechatronic System Architecture Developments for Semicon Equipment

Pasfoto Gregor van Baars
Senior System Engineer
(TNO)
Pasfoto Thijs Kniknie
Innovation Manager
(ITEC BV)

15:15 Quantum Technology

Pasfoto Fokko de Vries
Roadmap Leader
(Qblox bv)
Pasfoto Clara Osorio
Senior Scientist
(TNO & QDNL)

Presentation Clara Osorio: Quantum Sensing - We live in a world of sensors constantly translating stimuli into electric signals.  Whether it’s the thermometers in our homes, the high-performance sensors in our smartphones, or the myriad sensors within the machinery fabricating such devices. As their ubiquity is undeniable, the impact of better sensors might be extensive and unexpected. During this talk, I will introduce Quantum Sensors, a type of sensor where a coherent transformation of quantum systems mediates the sensing process. I will provide examples of their use and describe TNO's and QDNL's programs aimed at accelerating their industrialization.

 

Presentation Fokko de Vries: Enabling useful quantum computing - Quantum computations that are useful for chemistry, material science and life science require at least a thousand to a million qubits. In order to perform operations on these qubits, Qblox has developed a highly distributed control architecture where each module executes control or readout operations on a small number of qubits. This entails sending real time sequences of electronic pulses and performing measurement operations. As a result, the control stack processes 1000s of outgoing and incoming pulses in full synchronicity while operating with minimal precompilation and communication overhead. This scalable solution is a key enabling technology to move quantum computers from the lab to useful applications.

 

 

16:00 Wrap-up & Closure

16:15 Drinks, networking and Innovation Market